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Date: 2017
Language: eng
Resource Type: journal article
Identifier: http://hdl.handle.net/1959.13/1352036
Description: Deep eutectic solvents (DESs) have been prepared from mixtures of alkyl ammonium bromide salts (ethylammonium bromide, propylammonium bromide and butylammonium bromide) and glycerol at a 1: 2 M ratio.... More
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Reviewed: Reviewed
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Date: 2017
Language: eng
Resource Type: journal article
Identifier: http://hdl.handle.net/1959.13/1349709
Description: The atomic force microscope (AFM) is an invaluable scientific tool; however, its conventional implementation as a relatively costly macroscale system is a barrier to its more widespread use. A microel... More
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Reviewed: Reviewed
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Date: 2016
Language: eng
Resource Type: thesis
Identifier: http://hdl.handle.net/1959.13/1315720
Description: Research Doctorate - Doctor of Philosophy (PhD)
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Creators: Maroufi, Mohammad
Date: 2015
Language: eng
Resource Type: thesis
Identifier: http://hdl.handle.net/1959.13/1309594
Description: Research Doctorate - Doctor of Philosophy (PhD)
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Creators: Karvinen, Kai
Date: 2014
Language: eng
Resource Type: thesis
Identifier: http://hdl.handle.net/1959.13/1048191
Description: Research Doctorate - Doctor of Philosophy (PhD)
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Creators: Fowler, Anthony
Date: 2014
Language: eng
Resource Type: thesis
Identifier: http://hdl.handle.net/1959.13/1044990
Description: Research Doctorate - Doctor of Philosophy (PhD)
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Date: 2013
Language: eng
Resource Type: journal article
Identifier: http://hdl.handle.net/1959.13/1341288
Description: The atomic force microscope (AFM) [1] is a mechanical microscope capable of producing three-dimensional images of a wide variety of sample surfaces with nanometer precision in air, vacuum, or liquid e... More
Reviewed: Reviewed
Date: 2013
Language: eng
Resource Type: journal article
Identifier: http://hdl.handle.net/1959.13/1295407
Description: In many conventional atomic force microscopes (AFMs), one of the key hurdles to high-speed scanning in constant-force contact mode is the low-feedback control bandwidth of the -axis loop. This paper p... More
Reviewed: Reviewed
Date: 2010
Language: eng
Resource Type: conference paper
Identifier: http://hdl.handle.net/1959.13/933483
Description: In this paper, we design feedback controllers for lateral and transversal axes of an AFM piezoelectric tube scanner. The controllers are constrained to keep the standard deviation of the measurement n... More
Reviewed: Reviewed
Date: 2009
Language: eng
Resource Type: journal article
Identifier: http://hdl.handle.net/1959.13/807639
Description: This paper describes the design of a flexure-guided, two-axis nanopositioner (scanner) driven by piezoelectric stack actuators. The scanner is specifically designed for high-speed scanning probe micro... More
Reviewed: Reviewed
Date: 2009
Language: eng
Resource Type: thesis
Identifier: uon:6591
Description: Research Doctorate - Doctor of Philosophy (PhD)
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Date: 2003
Language: eng
Resource Type: journal article
Identifier: http://hdl.handle.net/1959.13/33920
Description: Atomic force microscopy appears to be a useful tool for determining the contact angle for small particles. It is shown in this paper that the contact angle of a spherical polyethylene particle changes... More
Reviewed: Reviewed
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