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Creators: Fleming, Andrew J.
Date: 2013
Language: eng
Resource Type: journal article
Identifier: http://hdl.handle.net/1959.13/1299485
Description: Charge drive circuits can significantly reduce piezoelectric nonlinearity; however, they are rarely used in practice because of their limited low-frequency performance, their dependence of voltage gai... More
Reviewed: Reviewed
Date: 2011
Language: eng
Resource Type: conference paper
Identifier: http://hdl.handle.net/1959.13/1038529
Description: The scan rate of tapping mode Atomic Force Microscopy (AFM), when scanning in air, may be improved by reducing the quality (Q) factor of the micro-cantilever. Passive piezoelectric shunt control is im... More
Reviewed: Reviewed
Date: 2010
Language: eng
Resource Type: conference paper
Identifier: http://hdl.handle.net/1959.13/933907
Description: This paper presents a 12-electrode piezoelectric tube scanner for fast atomic force microscopy (AFM). The scanner is used simultaneously as a sensor and an actuator. The built-in sensing mechanism of ... More
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Reviewed: Reviewed
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Date: 2003
Language: eng
Resource Type: journal article
Identifier: uon:2606
Description: Research on shunted piezoelectric transducers, performed mainly over the past decade, has generated new opportunities for control of vibration and damping in flexible structures. This is made possible... More
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Reviewed: Reviewed
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