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Date: 2017
Language: eng
Resource Type: conference paper
Identifier: http://hdl.handle.net/1959.13/1348369
Description: This paper presents a novel microelectromechanical systems (MEMS) implementation of an on-chip atomic force microscope (AFM), fabricated using a silicon-on-insulator process. The device features an XY... More
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Reviewed: Reviewed
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Date: 2016
Language: eng
Resource Type: conference paper
Identifier: http://hdl.handle.net/1959.13/1346475
Description: In a scanning probe microscope (SPM), the image is obtained by scanning a sample relative to a physical probe which captures the topography. The conventional scanning method is a raster pattern where ... More
Reviewed: Reviewed
Date: 2010
Language: eng
Resource Type: journal article
Identifier: http://hdl.handle.net/1959.13/933014
Description: We examine the effects of local turbulence Reynolds number R⋋ and inflow conditions on the magnitude of vorticity in plane turbulent wakes. Measurements of the spanwise component (ω₃) of the fluctuati... More
Reviewed: Reviewed
Date: 2005
Language: eng
Resource Type: journal article
Identifier: uon:488
Description: Hot-wire measurements of the spanwise vorticity fluctuation omega(z) have been carried out in a turbulent boundary layer subjected to concentrated suction, applied through a porous wall strip. The res... More
Date: 2005
Language: eng
Resource Type: journal article
Identifier: uon:64
Description: The effective-angle and look-up-table calibrations are used to reduce X-wire datasets in two flows: decaying grid turbulence at R(lambda)similar or equal to50 and the far field of a circular jet at R(... More
Reviewed: Reviewed
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